Inventor
DOYLE DANIEL
US16 patents
⚠️ This page may combine multiple inventors who share the name “DOYLE DANIEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
9 patentsUS7593272B2Sep 22, 2009
Detection of row-to-row shorts and other row decode defects in memory devices
MICRON TECHNOLOGY INC18 citations92
US7561472B2Jul 14, 2009
NAND architecture memory with voltage sensing
MICRON TECHNOLOGY INC23 citations92
US7307896B2Dec 11, 2007
Detection of row-to-row shorts and other row decode defects in memory devices
MICRON TECHNOLOGY INC19 citations92
US7596035B2Sep 29, 2009
Memory device bit line sensing system and method that compensates for bit line resistance variations
MICRON TECHNOLOGY INC18 citations89
US10372369B2Aug 6, 2019
Apparatuses and methods for single level cell caching
MICRON TECHNOLOGY INC1 citations72
US10353615B2Jul 16, 2019
Apparatuses and methods for single level cell caching
MICRON TECHNOLOGY INC2 citations72
US10048887B2Aug 14, 2018
Apparatuses and methods for single level cell caching
MICRON TECHNOLOGY INC3 citations72
US7855922B2Dec 21, 2010
Memory device bit line sensing system and method that compensates for bit line resistance variations
MICRON TECHNOLOGY INC2 citations59
US10846008B2Nov 24, 2020
Apparatuses and methods for single level cell caching
MICRON TECHNOLOGY INC0 citations51
DOYLE DANIEL
4 patentsUS8570807B2Oct 29, 2013
NAND architecture memory with voltage sensing
DOYLE DANIEL1 citations60
US8295088B2Oct 23, 2012
NAND architecture memory with voltage sensing
DOYLE DANIEL2 citations60
US8102723B2Jan 24, 2012
Memory device bit line sensing system and method that compensates for bit line resistance variations
DOYLE DANIEL1 citations57
US8633513B2Jan 21, 2014
Structures and methods for reducing junction leakage in semiconductor devices
DOYLE DANIEL0 citations45