P

Inventor

PARK DAE-GYU

US92 patents
⚠️ This page may combine multiple inventors who share the name “PARK DAE-GYU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

24 patents
US8043920B2Oct 25, 2011

finFETS and methods of making same

IBM91 citations97
US7279413B2Oct 9, 2007

High-temperature stable gate structure with metallic electrode

IBM53 citations96
US9059016B1Jun 16, 2015

Lateral heterojunction bipolar transistors

IBM27 citations93
US7439128B2Oct 21, 2008

Method of creating deep trench capacitor using a P+ metal electrode

IBM22 citations93
US7084024B2Aug 1, 2006

Gate electrode forming methods using conductive hard mask

IBM40 citations93
US7023064B2Apr 4, 2006

Temperature stable metal nitride gate electrode

IBM32 citations93
US6909137B2Jun 21, 2005

Method of creating deep trench capacitor using a P+ metal electrode

IBM20 citations93
US7872303B2Jan 18, 2011

FinFET with longitudinal stress in a channel

IBM31 citations92
US7867839B2Jan 11, 2011

Method to reduce threshold voltage (Vt) in silicon germanium (SiGe), high-k dielectric-metal gate, p-type metal oxide semiconductor field effect transistors

IBM21 citations92
US7863126B2Jan 4, 2011

Fabrication of a CMOS structure with a high-k dielectric layer oxidizing an aluminum layer in PFET region

IBM25 citations92
US7504700B2Mar 17, 2009

Method of forming an ultra-thin [[HfSiO]] metal silicate film for high performance CMOS applications and semiconductor structure formed in said method

IBM26 citations92
US7989298B1Aug 2, 2011

Transistor having V-shaped embedded stressor

IBM27 citations90
US9391171B2Jul 12, 2016

Fin field effect transistor including a strained epitaxial semiconductor shell

IBM5 citations84
US9306038B1Apr 5, 2016

Shallow extension junction

IBM10 citations84
US9034748B2May 19, 2015

Process variability tolerant hard mask for replacement metal gate finFET devices

IBM13 citations84
US9023697B2May 5, 2015

3D transistor channel mobility enhancement

IBM6 citations84
US8030716B2Oct 4, 2011

Self-aligned CMOS structure with dual workfunction

IBM8 citations84
US7947549B2May 24, 2011

Gate effective-workfunction modification for CMOS

IBM7 citations84
US7683418B2Mar 23, 2010

High-temperature stable gate structure with metallic electrode

IBM10 citations84
US7611979B2Nov 3, 2009

Metal gates with low charge trapping and enhanced dielectric reliability characteristics for high-k gate dielectric stacks

IBM8 citations84
US7893502B2Feb 22, 2011

Threshold voltage improvement employing fluorine implantation and adjustment oxide layer

IBM12 citations83
US7485910B2Feb 3, 2009

Simplified vertical array device DRAM/eDRAM integration: method and structure

IBM7 citations74
US9711416B2Jul 18, 2017

Fin field effect transistor including a strained epitaxial semiconductor shell

IBM2 citations73
US9275907B2Mar 1, 2016

3D transistor channel mobility enhancement

IBM5 citations73

HYUNDAI ELECTRONICS IND

9 patents

HYNIX SEMICONDUCTOR INC

6 patents

CAI JIN

3 patents

CHAN KEVIN K

3 patents

YUHAN CORP

2 patents

HEKMATSHOAR-TABARI BAHMAN

1 patent

YIN HAIZHOU

1 patent

CHEN XIANGDONG

1 patent

Showing the top 50 of 92 patents by PatentIndex Score.