Inventor
LEE BYONG-KWON
KR5 patents
Patents
5 patentsUS6822330B2Nov 23, 2004
Semiconductor integrated circuit device with test element group circuit
SAMSUNG ELECTRONICS CO LTD24 citations91
US7068058B2Jun 27, 2006
Semiconductor integrated circuit device with test element group circuit
SAMSUNG ELECTRONICS CO LTD7 citations72
US6714038B2Mar 30, 2004
Apparatus for controlling input termination of semiconductor memory device and method for the same
SAMSUNG ELECTRONICS CO LTD7 citations72
US7971117B2Jun 28, 2011
Test circuits of semiconductor memory device for multi-chip testing and method for testing multi chips
SAMSUNG ELECTRONICS CO LTD5 citations62
US7340560B2Mar 4, 2008
Methods and devices for accessing a memory using multiple separate address mapped temporary storage areas
SAMSUNG ELECTRONICS CO LTD0 citations44