Inventor

TANG DAVID W

US2 patents

Patents

2 patents

US10148367B1Dec 4, 2018

Built-in-test (BIT) for assignment-based AESA systems

RAYTHEON CO4 citations63

US10425172B2Sep 24, 2019

Clutter rejecting built in test for assignment-based AESA systems

RAYTHEON CO0 citations31