Inventor
HONG JAEWAN
KR8 patents
⚠️ This page may combine multiple inventors who share the name “HONG JAEWAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PSIA CORP
2 patentsUS6185991B1Feb 13, 2001
Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode
PSIA CORP80 citations91
US6677567B2Jan 13, 2004
Scanning probe microscope with improved scan accuracy, scan speed, and optical vision
PSIA CORP20 citations90