Inventor
MAYNARD DANIEL N
US29 patents
⚠️ This page may combine multiple inventors who share the name “MAYNARD DANIEL N”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
25 patentsUS7503020B2Mar 10, 2009
IC layout optimization to improve yield
IBM110 citations97
US6738954B1May 18, 2004
Method for prediction random defect yields of integrated circuits with accuracy and computation time controls
IBM98 citations95
US5636133AJun 3, 1997
Efficient generation of fill shapes for chips and packages
IBM73 citations95
US7893468B2Feb 22, 2011
Optical sensor including stacked photodiodes
IBM25 citations92
US7353472B2Apr 1, 2008
System and method for testing pattern sensitive algorithms for semiconductor design
IBM14 citations92
US6823496B2Nov 23, 2004
Physical design characterization system
IBM26 citations90
US7076749B2Jul 11, 2006
Method and system for improving integrated circuit manufacturing productivity
IBM22 citations89
US7404174B2Jul 22, 2008
method for generating a set of test patterns for an optical proximity correction algorithm
IBM11 citations84
US7883916B2Feb 8, 2011
Optical sensor including stacked photosensitive diodes
IBM19 citations83
US7404164B2Jul 22, 2008
IC design modeling allowing dimension-dependent rule checking
IBM10 citations83
US7584077B2Sep 1, 2009
Physical design characterization system
IBM11 citations80
US7284230B2Oct 16, 2007
System for search and analysis of systematic defects in integrated circuits
IBM6 citations73
US7818694B2Oct 19, 2010
IC layout optimization to improve yield
IBM2 citations62
US7703061B2Apr 20, 2010
IC design modeling allowing dimension-dependent rule checking
IBM2 citations62
US7555735B2Jun 30, 2009
IC design modeling allowing dimension-dependent rule checking
IBM1 citations62
US7415695B2Aug 19, 2008
System for search and analysis of systematic defects in integrated circuits
IBM3 citations62
US7389480B2Jun 17, 2008
Content based yield prediction of VLSI designs
IBM2 citations61
US6021267AFeb 1, 2000
Aspect ratio program for optimizing semiconductor chip shape
IBM5 citations53
US7752580B2Jul 6, 2010
Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique
IBM0 citations51
US7752589B2Jul 6, 2010
Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design
IBM0 citations51
US7685544B2Mar 23, 2010
Testing pattern sensitive algorithms for semiconductor design
IBM0 citations51
US7661081B2Feb 9, 2010
Content based yield prediction of VLSI designs
IBM1 citations51
US7577927B2Aug 18, 2009
IC design modeling allowing dimension-dependent rule checking
IBM0 citations51
US7552417B2Jun 23, 2009
System for search and analysis of systematic defects in integrated circuits
IBM0 citations51
US7398485B2Jul 8, 2008
Yield optimization in router for systematic defects
IBM0 citations41