Inventor
BELLO ABNER F
US3 patents
Patents
3 patentsUS9318388B2Apr 19, 2016
Methods of forming substantially self-aligned isolation regions on FinFET semiconductor devices and the resulting devices
GLOBALFOUNDRIES INC9 citations82
US9093302B2Jul 28, 2015
Methods of forming substantially self-aligned isolation regions on FinFET semiconductor devices and the resulting devices
GLOBALFOUNDRIES INC10 citations82
US8975094B2Mar 10, 2015
Test structure and method to facilitate development/optimization of process parameters
GLOBALFOUNDRIES INC3 citations57