Inventor
YE JUN
CN207 patents
⚠️ This page may combine multiple inventors who share the name “YE JUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BRION TECH INC
24 patentsUS7587704B2Sep 8, 2009
System and method for mask verification using an individual mask error model
BRION TECH INC483 citations99
US7120895B2Oct 10, 2006
System and method for lithography simulation
BRION TECH INC73 citations99
US7111277B2Sep 19, 2006
System and method for lithography simulation
BRION TECH INC65 citations99
US7003758B2Feb 21, 2006
System and method for lithography simulation
BRION TECH INC281 citations99
US6969837B2Nov 29, 2005
System and method for lithography process monitoring and control
BRION TECH INC82 citations99
US6884984B2Apr 26, 2005
System and method for lithography process monitoring and control
BRION TECH INC101 citations99
US6828542B2Dec 7, 2004
System and method for lithography process monitoring and control
BRION TECH INC120 citations99
US6820028B2Nov 16, 2004
Method and apparatus for monitoring integrated circuit fabrication
BRION TECH INC81 citations99
US6807503B2Oct 19, 2004
Method and apparatus for monitoring integrated circuit fabrication
BRION TECH INC126 citations99
US6806456B1Oct 19, 2004
System and method for lithography process monitoring and control
BRION TECH INC86 citations99
US6803554B2Oct 12, 2004
System and method for lithography process monitoring and control
BRION TECH INC107 citations99
US7694267B1Apr 6, 2010
Method for process window optimized optical proximity correction
BRION TECH INC86 citations98
US7114145B2Sep 26, 2006
System and method for lithography simulation
BRION TECH INC63 citations98
US7053355B2May 30, 2006
System and method for lithography process monitoring and control
BRION TECH INC93 citations98
US6969864B2Nov 29, 2005
System and method for lithography process monitoring and control
BRION TECH INC71 citations98
US6959255B2Oct 25, 2005
Method and apparatus for monitoring integrated circuit fabrication
BRION TECH INC67 citations98
US6906305B2Jun 14, 2005
System and method for aerial image sensing
BRION TECH INC69 citations98
US7695876B2Apr 13, 2010
Method for identifying and using process window signature patterns for lithography process control
BRION TECH INC61 citations97
US7488933B2Feb 10, 2009
Method for lithography model calibration
BRION TECH INC58 citations97
US7703069B1Apr 20, 2010
Three-dimensional mask model for photolithography simulation
BRION TECH INC128 citations96
US7617477B2Nov 10, 2009
Method for selecting and optimizing exposure tool using an individual mask error model
BRION TECH INC47 citations96
US7117478B2Oct 3, 2006
System and method for lithography simulation
BRION TECH INC61 citations96
US6892156B2May 10, 2005
Method and apparatus for monitoring integrated circuit fabrication
BRION TECH INC53 citations96
US6879924B2Apr 12, 2005
Method and apparatus for monitoring integrated circuit fabrication
BRION TECH INC62 citations96
ON BRIGHT ELECTRONICS SHANGHAI CO LTD
6 patentsUS7679938B2Mar 16, 2010
System and method for providing control for switch-mode power supply
ON BRIGHT ELECTRONICS SHANGHAI CO LTD47 citations98
US7492619B2Feb 17, 2009
System and method for providing control for switch-mode power supply
ON BRIGHT ELECTRONICS SHANGHAI CO LTD83 citations98
US7345895B2Mar 18, 2008
Adaptive multi-level threshold system and method for power converter protection
ON BRIGHT ELECTRONICS SHANGHAI CO LTD59 citations98
US7099164B2Aug 29, 2006
Adaptive multi-level threshold system and method for power converter protection
ON BRIGHT ELECTRONICS SHANGHAI CO LTD72 citations98
US7795851B2Sep 14, 2010
System and method for adaptive switching frequency control
ON BRIGHT ELECTRONICS SHANGHAI CO LTD19 citations93
US7746615B2Jun 29, 2010
Adaptive multi-level threshold system and method for power converter protection
ON BRIGHT ELECTRONICS SHANGHAI CO LTD37 citations93
ASML NETHERLANDS BV
6 patentsUS7853920B2Dec 14, 2010
Method for detecting, sampling, analyzing, and correcting marginal patterns in integrated circuit manufacturing
ASML NETHERLANDS BV67 citations97
US9111062B2Aug 18, 2015
Fast freeform source and mask co-optimization method
ASML NETHERLANDS BV22 citations93
US8938694B2Jan 20, 2015
Three-dimensional mask model for photolithography simulation
ASML NETHERLANDS BV22 citations93
US8352885B2Jan 8, 2013
Three-dimensional mask model for photolithography simulation
ASML NETHERLANDS BV21 citations93
US7999920B2Aug 16, 2011
Method of performing model-based scanner tuning
ASML NETHERLANDS BV22 citations93
US7873937B2Jan 18, 2011
System and method for lithography simulation
ASML NETHERLANDS BV9 citations93
ONETTA INC
4 patentsUS6441950B1Aug 27, 2002
Distributed raman amplifier systems with transient control
ONETTA INC123 citations98
US6417965B1Jul 9, 2002
Optical amplifier control system
ONETTA INC80 citations97
US6529316B1Mar 4, 2003
Optical network equipment with optical channel monitor and dynamic spectral filter alarms
ONETTA INC69 citations96
US6341034B1Jan 22, 2002
Optical amplifier system with transient control using spectrally filtered input
ONETTA INC60 citations96
YE JUN
3 patentsUS8200468B2Jun 12, 2012
Methods and system for lithography process window simulation
YE JUN147 citations99
US8057967B2Nov 15, 2011
Process window signature patterns for lithography process control
YE JUN39 citations96
US8570485B2Oct 29, 2013
Lens heating compensation systems and methods
YE JUN24 citations93
KLA TENCOR
2 patentsCHEN LUOQI
1 patentBRION TECNOLOGIES INC
1 patentCEPTON TECHNOLOGIES INC
1 patentLIU PENG
1 patentLIN YUAN
1 patentShowing the top 50 of 207 patents by PatentIndex Score.