Inventor
ZHENG SCOTT
US2 patents
Patents
2 patentsUS6005409ADec 21, 1999
Detection of process-induced damage on transistors in real time
ADVANCED MICRO DEVICES INC8 citations71
US5966024AOct 12, 1999
Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle
ADVANCED MICRO DEVICES INC16 citations68