Inventor
BARNETT THOMAS S
US7 patents
⚠️ This page may combine multiple inventors who share the name “BARNETT THOMAS S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
4 patentsUS6789032B2Sep 7, 2004
Method of statistical binning for reliability selection
IBM63 citations91
US7917451B2Mar 29, 2011
Methods, apparatus, and program products to optimize semiconductor product yield prediction for performance and leakage screens
IBM10 citations82
US7139944B2Nov 21, 2006
Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability
IBM15 citations79
US7477961B2Jan 13, 2009
Equivalent gate count yield estimation for integrated circuit devices
IBM0 citations36