Inventor

DE WOLF PETER

BE5 patents

⚠️ This page may combine multiple inventors who share the name “DE WOLF PETER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IMEC VZW

2 patents

US5723981AMar 3, 1998

Method for measuring the electrical potential in a semiconductor element

IMEC VZW73 citations94

US6091248AJul 18, 2000

Method for measuring the electrical potential in a semiconductor element

IMEC VZW43 citations90

IMEC

1 patent

US6201401B1Mar 13, 2001

Method for measuring the electrical potential in a semiconductor element

IMEC50 citations90

IMEC INTER UNI MICRO ELECTR

1 patent

US5585734ADec 17, 1996

Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope

IMEC INTER UNI MICRO ELECTR31 citations84

VEECO INSTR INC

1 patent

US6287880B1Sep 11, 2001

Method and apparatus for high resolution profiling in semiconductor structures

VEECO INSTR INC12 citations71