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Inventor
TAKKEN ASYA
US
2 patents
Patents
2 patents
US7752581B2
Jul 6, 2010
Design structure and system for identification of defects on circuits or other arrayed products
IBM
17 citations
78
US7346470B2
Mar 18, 2008
System for identification of defects on circuits or other arrayed products
IBM
10 citations
78