Inventor
FITCH RYAN A
US19 patents
⚠️ This page may combine multiple inventors who share the name “FITCH RYAN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
15 patentsUS9116205B2Aug 25, 2015
Test coverage of integrated circuits with test vector input spreading
IBM8 citations83
US9103879B2Aug 11, 2015
Test coverage of integrated circuits with test vector input spreading
IBM9 citations83
US8856720B2Oct 7, 2014
Test coverage of integrated circuits with masking pattern selection
IBM9 citations83
US8667431B1Mar 4, 2014
Test coverage of integrated circuits with masking pattern selection
IBM6 citations83
US8898530B1Nov 25, 2014
Dynamic built-in self-test system
IBM4 citations72
US9032256B2May 12, 2015
Multi-core processor comparison encoding
IBM5 citations68
US9285423B2Mar 15, 2016
Managing chip testing data
IBM2 citations63
US9069041B2Jun 30, 2015
Self evaluation of system on a chip with multiple cores
IBM2 citations62
US9746516B2Aug 29, 2017
Collecting diagnostic data from chips
IBM1 citations52
US9372232B2Jun 21, 2016
Collecting diagnostic data from chips
IBM1 citations52
US9568549B2Feb 14, 2017
Managing redundancy repair using boundary scans
IBM0 citations51
US9201117B2Dec 1, 2015
Managing redundancy repair using boundary scans
IBM0 citations51
US9188636B2Nov 17, 2015
Self evaluation of system on a chip with multiple cores
IBM0 citations51
US9003244B2Apr 7, 2015
Dynamic built-in self-test system
IBM0 citations51
US7830195B2Nov 9, 2010
Self-test design methodology and technique for root-gated clocking structure
IBM0 citations38
DOUSKEY STEVEN M
3 patentsUS8516318B2Aug 20, 2013
Dynamic scan
DOUSKEY STEVEN M2 citations59
US8762803B2Jun 24, 2014
Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs)
DOUSKEY STEVEN M0 citations49
US8627162B2Jan 7, 2014
Iimplementing enhanced aperture function calibration for logic built in self test (LBIST)
DOUSKEY STEVEN M0 citations49