Inventor
KITAI TADASHI
JP25 patents
⚠️ This page may combine multiple inventors who share the name “KITAI TADASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KITAI TADASHI
10 patentsUS9317914B2Apr 19, 2016
Image inspecting device, image forming system, and computer program product
KITAI TADASHI9 citations83
US9823884B2Nov 21, 2017
Inspection system, printer, and print-position notification method
KITAI TADASHI5 citations72
US9088745B2Jul 21, 2015
Apparatus, system, and method of inspecting image, and recording medium storing image inspection control program
KITAI TADASHI5 citations72
US9106771B2Aug 11, 2015
Image inspection device, image inspection system, and image inspection method
KITAI TADASHI3 citations62
US8970931B2Mar 3, 2015
Image reading device employing calibration plate, apparatus including image reading device, image reading controlling method, and recording medium storing image reading control program
KITAI TADASHI2 citations61
US8792128B2Jul 29, 2014
Apparatus, system, and method of inspecting image, and recording medium storing image inspection control program
KITAI TADASHI2 citations61
US11934713B2Mar 19, 2024
Image forming system, inspection device, and inspection method
KITAI TADASHI0 citations51
US11645016B2May 9, 2023
Image forming system, inspection device, and inspection method
KITAI TADASHI0 citations51
US9013772B2Apr 21, 2015
Apparatus, system, and method of inspecting image, and computer-readable medium storing image inspection control program
KITAI TADASHI1 citations50
US9065938B2Jun 23, 2015
Apparatus, system, and method of inspecting image, and recording medium storing image inspection control program
KITAI TADASHI0 citations40
RICOH CO LTD
3 patentsUS9898814B2Feb 20, 2018
Image inspection apparatus, image inspection method, and control program of image inspection apparatus
RICOH CO LTD24 citations93
US9342898B2May 17, 2016
Image inspection system, image inspection method, and recording medium storing image inspection program
RICOH CO LTD4 citations72
US9390493B2Jul 12, 2016
Image inspection apparatus, image inspection method, and control program of image inspection apparatus
RICOH CO LTD4 citations71
KANEKO HITOMI
3 patentsUS9064297B2Jun 23, 2015
Image inspection apparatus, image inspection system and image inspection method
KANEKO HITOMI6 citations71
US8848244B2Sep 30, 2014
Image inspection method, apparatus, control program overlapping inspection images to obtain positional shift
KANEKO HITOMI4 citations71
US9233551B2Jan 12, 2016
Apparatus, system, and method of inspecting image, and recording medium storing image inspection control program
KANEKO HITOMI1 citations51
KOJIMA KEIJI
2 patentsMIYAGAWA HIROMITSU
2 patentsUS9077927B2Jul 7, 2015
Image inspection system and image inspection method for determining a threshold useable for defect detection in a scanned image based upon a reference image with an artificial defect
MIYAGAWA HIROMITSU4 citations67
US11470207B2Oct 11, 2022
Image processing apparatus, image processing system, image processing method, and non-transitory computer-readable storage medium
MIYAGAWA HIROMITSU0 citations57