Inventor
FANG TSUNG-PAO
US4 patents
⚠️ This page may combine multiple inventors who share the name “FANG TSUNG-PAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHEN CHIEN-HUEI ADAM
2 patentsUS8139844B2Mar 20, 2012
Methods and systems for determining a defect criticality index for defects on wafers
CHEN CHIEN-HUEI ADAM11 citations82
US8213705B2Jul 3, 2012
Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer
CHEN CHIEN-HUEI ADAM1 citations49