Inventor

ARAKAWA YASUTAKA

JP2 patents

⚠️ This page may combine multiple inventors who share the name “ARAKAWA YASUTAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

1 patent

US7529631B2May 5, 2009

Defect detection system, defect detection method, and defect detection program

TOSHIBA KK13 citations80

ARAKAWA YASUTAKA

1 patent

US8283940B2Oct 9, 2012

Probe device, processing device, and probe testing method

ARAKAWA YASUTAKA1 citations36