Inventor
AYRES SCOTT L
US4 patents
Patents
4 patentsUS6530045B1Mar 4, 2003
Apparatus and method for testing rambus DRAMs
MICRON TECHNOLOGY INC54 citations93
US7168018B2Jan 23, 2007
Apparatus and method for reducing test resources in testing DRAMs
MICRON TECHNOLOGY INC6 citations72
US6986084B2Jan 10, 2006
Apparatus and method for reducing test resources in testing DRAMS
MICRON TECHNOLOGY INC5 citations72
US6854079B1Feb 8, 2005
Apparatus and method for reducing test resources in testing Rambus DRAMs
MICRON TECHNOLOGY INC8 citations72