Inventor
IKEDA SHIGEO
JP19 patents
⚠️ This page may combine multiple inventors who share the name “IKEDA SHIGEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEIKO EPSON CORP
10 patentsUS5739596AApr 14, 1998
Power supply for an electronic device and power delivery method therefor
SEIKO EPSON CORP262 citations95
US9280305B2Mar 8, 2016
Client device using a markup language to control a periphery device via a printer
SEIKO EPSON CORP10 citations92
US9697509B2Jul 4, 2017
Control system, control method thereof, and controller thereof
SEIKO EPSON CORP4 citations72
US10402809B2Sep 3, 2019
Point-of-sale printer interpreting a markup language from a client device to control a scanner using scanner-control commands
SEIKO EPSON CORP0 citations51
US10108949B2Oct 23, 2018
Printer communicating with a computing device that has access to a target-device script that initiates a control object to control a target device
SEIKO EPSON CORP0 citations51
US10043169B2Aug 7, 2018
Point-of-sale printer interpreting a markup language from a client device to control a scanner using scanner-control commands
SEIKO EPSON CORP0 citations51
US9495121B2Nov 15, 2016
Client device using a markup language to control a periphery device via a point-of-sale printer
SEIKO EPSON CORP0 citations51
US9274730B2Mar 1, 2016
Client device using a web browser to control a periphery device via a printer
SEIKO EPSON CORP0 citations51
US9052853B2Jun 9, 2015
Client device using a web browser to control a periphery device via a printer
SEIKO EPSON CORP0 citations51
US10572197B2Feb 25, 2020
Information processing apparatus and information processing method
SEIKO EPSON CORP0 citations37
SONY CORP
4 patentsUS5783815AJul 21, 1998
Light receiving device having lens fitting element
SONY CORP142 citations98
US6795120B2Sep 21, 2004
Solid-state imaging apparatus and camera using the same
SONY CORP179 citations97
US6174174B1Jan 16, 2001
Socket for IC and method for manufacturing IC
SONY CORP66 citations91
US5574383ANov 12, 1996
IC tester and measuring method
SONY CORP34 citations90