Inventor

LIU XUEFENG

US132 patents

⚠️ This page may combine multiple inventors who share the name “LIU XUEFENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LIU XUEFENG

IBM

Semiconductor devices

Vertical LC tank device

Vertical LC tank device

Semiconductor structure

On-chip inductor with magnetic core

Optimized blocking impurity placement for SiGe HBTs

Integrating a junction field effect transistor into a vertical field effect transistor

Forming vertical transport field effect transistors with uniform bottom spacer thickness

Forming eDRAM unit cell with VFET and via capacitance

Method of forming alternating regions of Si and SiGe or SiGeC on a buried oxide layer on a substrate

Integrated millimeter wave antenna and transceiver on a substrate

Method for forming an on-chip high frequency electro-static discharge device

Semiconductor structure and method of manufacture

On-chip inductor with magnetic core

Multiple layer structure for substrate noise isolation

Silicon dioxide removing method

Two step fin etch and reveal for VTFETs and high breakdown LDVTFETs

Structure, system and method for device radio frequency (RF) reliability

Design structure for an on-chip high frequency electro-static discharge device

Integrating metal-insulator-metal capacitors with fabrication of vertical field effect transistors

Electrostatic discharge protection using vertical fin CMOS technology

Avoiding gate metal via shorting to source or drain contacts

Integration of bipolar transistor into complimentary metal-oxide-semiconductor process

Magnetoresistive random access memory thin film transistor unit cell

KLA TENCOR CORP

Method and system for determining one or more optical characteristics of structure of a semiconductor wafer

Metrology systems and methods for high aspect ratio and large lateral dimension structures

Photocathode including field emitter array on a silicon substrate with boron layer

Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors

Electron source

Electron source

Multi-column electron beam lithography including field emitters on a silicon substrate with boron layer

Process aware metrology

Overlay metrology system and method

DING HANYI

Integrated millimeter wave antenna and transceiver on a substrate

Structure of very high insertion loss of the substrate noise decoupling

Structure for an on-chip high frequency electro-static discharge device

Integrated millimeter wave antenna and transceiver on a substrate

Semiconductor structure including a high performance fet and a high voltage fet on an SOI substrate

KLA CORP

Sensitive particle detection with spatially-varying polarization rotator and polarizer

Frequency conversion using interdigitated nonlinear crystal gratings

UNIV GEORGETOWN

Immortalization of epithelial cells and methods of use

Immortalization of epithelial cells and methods of use

KUZNETSOV ALEXANDER

Method of electromagnetic modeling of finite structures and finite illumination for metrology and inspection

SCHLEGEL RICHARD

Immortalization of epithelial cells and methods of use

SHANDONG HERITAGE HIGHWAY MATE

Multigrade asphalt power additive

COOLBAUGH DOUGLAS D

Silicided trench contact to buried conductive layer

COLLINS DAVID S

Lateral passive device having dual annular electrodes

DZIURA THADDEUS G

Method of optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrology

ZHAI GUANGJIE

Time-resolved single-photon or ultra-weak light multi-dimensional imaging spectrum system and method

LIU XUEFENG

Process aware metrology