Inventor
ALUMOT DROR
IL8 patents
⚠️ This page may combine multiple inventors who share the name “ALUMOT DROR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
4 patentsUS11022566B1Jun 1, 2021
Examination of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD13 citations82
US12579628B2Mar 17, 2026
Overlay measurement between layers of a semiconductor specimen based on center of symmetry (COS) localization
APPLIED MATERIALS ISRAEL LTD0 citations40
US12511720B2Dec 30, 2025
Image denoising for examination of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations38
US12423798B2Sep 23, 2025
Shape localization for examining a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations37
KLA TENCOR CORP
4 patentsUS10571811B2Feb 25, 2020
Device metrology targets and methods
KLA TENCOR CORP5 citations71
US10409171B2Sep 10, 2019
Overlay control with non-zero offset prediction
KLA TENCOR CORP3 citations71
US11054752B2Jul 6, 2021
Device metrology targets and methods
KLA TENCOR CORP0 citations61
US11862522B2Jan 2, 2024
Accuracy improvements in optical metrology
KLA TENCOR CORP0 citations44