Inventor
HSUEH SHIH-CHENG
US11 patents
Patents
11 patentsUS7032194B1Apr 18, 2006
Layout correction algorithms for removing stress and other physical effect induced process deviation
XILINX INC87 citations96
US6563320B1May 13, 2003
Mask alignment structure for IC layers
XILINX INC21 citations92
US6426534B1Jul 30, 2002
Methods and circuits employing threshold voltages for mask-alignment detection
XILINX INC25 citations92
US6393714B1May 28, 2002
Resistor arrays for mask-alignment detection
XILINX INC39 citations92
US6305095B1Oct 23, 2001
Methods and circuits for mask-alignment detection
XILINX INC25 citations92
US6569576B1May 27, 2003
Reticle cover for preventing ESD damage
XILINX INC22 citations91
US6716653B2Apr 6, 2004
Mask alignment structure for IC layers
XILINX INC16 citations83
US6465305B1Oct 15, 2002
Methods and circuits employing threshold voltages for mask-alignment detection
XILINX INC8 citations73
US6436726B2Aug 20, 2002
Methods and circuits for mask-alignment detection
XILINX INC11 citations73
US6878561B2Apr 12, 2005
Mask-alignment detection circuit in X and Y directions
XILINX INC5 citations62
US6684520B1Feb 3, 2004
Mask-alignment detection circuit in x and y directions
XILINX INC4 citations62