Inventor
ELMALIACH NISSIM
IL7 patents
⚠️ This page may combine multiple inventors who share the name “ELMALIACH NISSIM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
4 patentsUS6809808B2Oct 26, 2004
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC23 citations92
US6366687B1Apr 2, 2002
Data converter apparatus and method particularly useful for a database-to-object inspection system
APPLIED MATERIALS INC28 citations91
US7053395B2May 30, 2006
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC10 citations73
US6853475B2Feb 8, 2005
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC11 citations73