Inventor
TSURUGA YASUKO
JP6 patents
Patents
6 patentsUS7329867B2Feb 12, 2008
Electron beam system and electron beam measuring and observing methods
TOPCON CORP20 citations92
US7151258B2Dec 19, 2006
Electron beam system and electron beam measuring and observing methods
TOPCON CORP22 citations92
US7539340B2May 26, 2009
Apparatus and method for three-dimensional coordinate measurement
TOPCON CORP9 citations83
US6751522B2Jun 15, 2004
Lens layout setting apparatus for lens grinding process and display apparatus for the same
TOPCON CORP13 citations83
US7850305B2Dec 14, 2010
Apparatus and method for measuring spectrum image data of eyeground
TOPCON CORP4 citations62
US6959227B2Oct 25, 2005
Lens layout setting apparatus for lens grinding process and display apparatus for the same
TOPCON CORP4 citations61