P

Inventor

LIN WEI-LIANG

TW85 patents
⚠️ This page may combine multiple inventors who share the name “LIN WEI-LIANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

33 patents
US11342193B2May 24, 2022

Method of manufacturing semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US10861698B2Dec 8, 2020

Pattern fidelity enhancement

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10790155B2Sep 29, 2020

Method of manufacturing semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10658184B2May 19, 2020

Pattern fidelity enhancement with directional patterning technology

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10497565B2Dec 3, 2019

Method for forming semiconductor device structure

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10049918B2Aug 14, 2018

Directional patterning methods

TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9679994B1Jun 13, 2017

High fin cut fabrication process

TAIWAN SEMICONDUCTOR MFG CO LTD18 citations84
US11791161B2Oct 17, 2023

Pattern fidelity enhancement

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11289332B2Mar 29, 2022

Directional processing to remove a layer or a material formed over a substrate

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11094556B2Aug 17, 2021

Method of manufacturing semiconductor devices using directional process

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11004729B2May 11, 2021

Method of manufacturing semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10950456B2Mar 16, 2021

High-density semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10714357B2Jul 14, 2020

Methods for improved critical dimension uniformity in a semiconductor device fabrication process

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10714485B2Jul 14, 2020

Semiconductor device which includes Fins

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10707081B2Jul 7, 2020

Fine line patterning methods

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10354874B2Jul 16, 2019

Directional processing to remove a layer or a material formed over a substrate

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9991132B2Jun 5, 2018

Lithographic technique incorporating varied pattern materials

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US9799529B2Oct 24, 2017

Method of planarizing a film layer

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US9728407B2Aug 8, 2017

Method of forming features with various dimensions

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9684236B1Jun 20, 2017

Method of patterning a film layer

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9449880B1Sep 20, 2016

Fin patterning methods for increased process margin

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations73
US10146141B2Dec 4, 2018

Lithography process and system with enhanced overlay quality

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12266539B2Apr 1, 2025

Method of manufacturing semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12148653B2Nov 19, 2024

Method of manufacturing semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11764068B2Sep 19, 2023

Method of manufacturing semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12334342B2Jun 17, 2025

Pattern fidelity enhancement

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12230507B2Feb 18, 2025

Method of manufacturing semiconductor devices using directional process

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12153350B2Nov 26, 2024

Method of manufacturing semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11955338B2Apr 9, 2024

Directional deposition for semiconductor fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11901188B2Feb 13, 2024

Method for improved critical dimension uniformity in a semiconductor device fabrication process

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11881401B2Jan 23, 2024

Method of forming metal features

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11862465B2Jan 2, 2024

Fine line patterning methods

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11848208B2Dec 19, 2023

Method for forming semiconductor device structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62

ACBEL POLYTECH INC

4 patents

MACRONIX INT CO LTD

4 patents

CHANG SHUN-TE

2 patents

WANG YEN-LUNG

1 patent

LIN WEI-LIANG

1 patent

LIN WEI LIANG

1 patent

WANG CHIEN-WEI

1 patent

LI DONG-SHENG

1 patent

LEE FANG-YU

1 patent

TENG SHIH-LIANG

1 patent

Showing the top 50 of 85 patents by PatentIndex Score.