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Inventor
JENKINS ED
US
2 patents
Patents
2 patents
US7215361B2
May 8, 2007
Method for automated testing of the modulation transfer function in image sensors
MICRON TECHNOLOGY INC
8 citations
71
US7646016B2
Jan 12, 2010
Method for automated testing of the modulation transfer function in image sensors
MICRON TECHNOLOGY INC
1 citations
60