Inventor · disambiguated record
Hidemi Shigekawa
Also filed as: SHIGEKAWA HIDEMI
5 granted patents·2 pending applications·18 citations·filing 2002–2025
72Inventor score
Top patents by PatentIndex Score
7 records- 0175US7961379B2Pump probe measuring device and scanning probe microscope apparatus using the deviceJAPAN SCIENCE & TECH AGENCY·Filed 2007·Granted Jun 14, 2011·5 cites·11 claims
- 0266US8982451B2Pump probe measuring deviceSHIGEKAWA HIDEMI·Filed 2012·Granted Mar 17, 2015·2 cites·20 claims
- 0359US7002149B2Delay time modulation femtosecond time-resolved scanning probe microscope apparatusJAPAN SCIENCE & TECH AGENCY·Filed 2002·Granted Feb 21, 2006·11 cites·9 claims
- 0454US2025389751A1Measurement system and measurement methodGTHERANOSTICS CO LTD·Filed 2025·Application pending·0 cites
- 0551US11320456B2Scanning probe microscopeGTHERANOSTICS CO LTD·Filed 2019·Granted May 3, 2022·0 cites·6 claims
- 0649US12222365B2Optical output system, measurement system, optical pump-probe scanning tunneling microscope system, computing device, program, and computing methodGTHERANOSTICS CO LTD·Filed 2019·Granted Feb 11, 2025·0 cites·20 claims
- 0737US2025003881A1Raman scattered light measurement system and raman scattered light measurement methodBIO XCELERATOR INC·Filed 2022·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →