P

Inventor

FUKUDA KAZUYOSHI

JP8 patents
⚠️ This page may combine multiple inventors who share the name “FUKUDA KAZUYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

4 patents
US6127729AOct 3, 2000

Semiconductor chip with corner electrode terminals and detecting wiring for defect inspection

MITSUBISHI ELECTRIC CORP38 citations90
US6448783B1Sep 10, 2002

Method of inspecting semiconductor chip with projecting electrodes for defects

MITSUBISHI ELECTRIC CORP7 citations71
US6362523B1Mar 26, 2002

Semiconductor device

MITSUBISHI ELECTRIC CORP13 citations71
US6184569B1Feb 6, 2001

Semiconductor chip inspection structures

MITSUBISHI ELECTRIC CORP3 citations60

TOSHIBA KK

2 patents
USD480371SOct 7, 2003

Semiconductor device

TOSHIBA KK23 citations89
USD473199SApr 15, 2003

Portion of semiconductor device

TOSHIBA KK16 citations81

YAMADA HIROMICHI

1 patent
US9323595B2Apr 26, 2016

Microcontroller, control device and determination method

YAMADA HIROMICHI4 citations70

RENESAS ELECTRONICS CORP

1 patent
US9229830B2Jan 5, 2016

Semiconductor integrated circuit device and microcontroller

RENESAS ELECTRONICS CORP1 citations49