Inventor
ECHIZENYA AKIRA
JP3 patents
Patents
3 patentsUS7542548B2Jun 2, 2009
X-ray optical system
RIGAKU DENKI CO LTD18 citations81
US7860217B2Dec 28, 2010
X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same
RIGAKU DENKI CO LTD6 citations60
USD566278SApr 8, 2008
X-ray analysis device
RIGAKU DENKI CO LTD2 citations53