Inventor

ARIEL ASSAF

IL3 patents

Patents

3 patents

US12223641B2Feb 11, 2025

Defect detection of a semiconductor specimen

APPLIED MATERIALS ISRAEL LTD1 citations52

US12469124B2Nov 11, 2025

Machine learning based yield prediction

APPLIED MATERIALS ISRAEL LTD0 citations42

US12561793B2Feb 24, 2026

Machine learning based examination for process monitoring

APPLIED MATERIALS ISRAEL LTD0 citations41