Inventor · disambiguated record
Hsun-Tai Wei
Also filed as: WEI HSUN-TAI
6 granted patents·2 pending applications·6 citations·filing 2020–2025
67Inventor score
Files withCHUNGHWA PREC TEST TECH CO LTD8
Top patents by PatentIndex Score
8 records- 0195US11226354B1Probe card device and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Jan 18, 2022·6 cites·9 claims
- 0256US2025350356A1Optoelectronic integrated circuit testing devicesCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 0349US11933817B2Probe card device and transmission structureCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Mar 19, 2024·0 cites·5 claims
- 0448US11287446B2Split thin-film probe cardCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Mar 29, 2022·0 cites·6 claims
- 0547US11209461B2Probe card device and neck-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Dec 28, 2021·0 cites·8 claims
- 0645US11204371B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Dec 21, 2021·0 cites·6 claims
- 0745US11175313B1Thin-film probe card and test module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Nov 16, 2021·0 cites·10 claims
- 0844US2022011346A1Probe card device and fan-out probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →