Inventor

NAGY ANDREAS

DE5 patents

⚠️ This page may combine multiple inventors who share the name “NAGY ANDREAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MULTITEST ELEKTRONISCHE SYST

3 patents

US7633304B2Dec 15, 2009

Device for testing electronic components, in particular ICs, having a sealing board arranged inside a pressure test chamber

MULTITEST ELEKTRONISCHE SYST5 citations59

US9255965B2Feb 9, 2016

System for post-processsing of electronic components

MULTITEST ELEKTRONISCHE SYST0 citations47

US9014841B2Apr 21, 2015

Device and method for removing tested semiconductor components

MULTITEST ELEKTRONISCHE SYST1 citations45

RICHTER REINHART

1 patent

US8717048B2May 6, 2014

System for post-processing of electronic components

RICHTER REINHART2 citations52

NAGY ANDREAS

1 patent

US8449002B2May 28, 2013

Closure mechanism for pressure test chambers for testing electronic components, in particular ICs

NAGY ANDREAS3 citations47