Inventor

OMURA RYUJI

JP5 patents

⚠️ This page may combine multiple inventors who share the name “OMURA RYUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

4 patents

US6345004B1Feb 5, 2002

Repair analysis circuit for redundancy, redundant repairing method, and semiconductor device

MITSUBISHI ELECTRIC CORP86 citations96

US6311300B1Oct 30, 2001

Semiconductor testing apparatus for testing semiconductor device including built in self test circuit

MITSUBISHI ELECTRIC CORP22 citations90

US5164665ANov 17, 1992

IC tester

MITSUBISHI ELECTRIC CORP24 citations89

US5142223AAug 25, 1992

Device for testing semiconductor device

MITSUBISHI ELECTRIC CORP24 citations88

RYODEN SEMICONDUCTOR SYST ENG

1 patent

US6584592B2Jun 24, 2003

Semiconductor testing apparatus for testing semiconductor device including built in self test circuit

RYODEN SEMICONDUCTOR SYST ENG9 citations71