Inventor

ZHENG YAOLEI

CN2 patents

⚠️ This page may combine multiple inventors who share the name “ZHENG YAOLEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA CORP

1 patent

US11043239B2Jun 22, 2021

Magneto-optic Kerr effect metrology systems

KLA CORP1 citations57

ZHU NANCHANG

1 patent

US8804106B2Aug 12, 2014

System and method for nondestructively measuring concentration and thickness of doped semiconductor layers

ZHU NANCHANG1 citations40