Inventor
VAN DE GRAAFF SCOTT
US15 patents
⚠️ This page may combine multiple inventors who share the name “VAN DE GRAAFF SCOTT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
14 patentsUS6822925B2Nov 23, 2004
Synchronous mirror delay with reduced delay line taps
MICRON TECHNOLOGY INC17 citations92
US6728152B2Apr 27, 2004
Sense amplifier for reduction of access device leakage
MICRON TECHNOLOGY INC21 citations92
US6570813B2May 27, 2003
Synchronous mirror delay with reduced delay line taps
MICRON TECHNOLOGY INC29 citations92
US6522592B2Feb 18, 2003
Sense amplifier for reduction of access device leakage
MICRON TECHNOLOGY INC29 citations92
US6628561B2Sep 30, 2003
Small anti-fuse circuit to facilitate parallel fuse blowing
MICRON TECHNOLOGY INC15 citations83
US6788587B2Sep 7, 2004
Small anti-fuse circuit to facilitate parallel fuse blowing
MICRON TECHNOLOGY INC8 citations73
US6700824B2Mar 2, 2004
Distributed cell plate and/or digit equilibrate voltage generator
MICRON TECHNOLOGY INC7 citations73
US6643219B2Nov 4, 2003
Synchronous mirror delay with reduced delay line taps
MICRON TECHNOLOGY INC7 citations73
US6496421B1Dec 17, 2002
Distributed cell plate and/or digit equilibrate voltage generator
MICRON TECHNOLOGY INC12 citations73
US6756815B2Jun 29, 2004
Input buffer with selectable operational characteristics
MICRON TECHNOLOGY INC6 citations62
US6741504B2May 25, 2004
Method and apparatus for reducing gate-induced diode leakage in semiconductor devices
MICRON TECHNOLOGY INC5 citations62
US6665232B2Dec 16, 2003
Synchronous mirror delay with reduced delay line taps
MICRON TECHNOLOGY INC3 citations62
US9335372B2May 10, 2016
Apparatus and methods for delay line testing
MICRON TECHNOLOGY INC1 citations51
US7023755B2Apr 4, 2006
Low power control circuit and method for a memory device
MICRON TECHNOLOGY INC0 citations48