Inventor · disambiguated record
Shinya Nishio
Also filed as: NISHIO SHINYA
5 granted patents·55 citations·filing 1996–2004
78Inventor score
Top patents by PatentIndex Score
5 records- 0173US5732009ASemiconductor integrated circuit device including a DRAM in which a cell selection transistor has a stabilized threshold voltageHITACHI LTD·Filed 1996·Granted Mar 24, 1998·33 cites·11 claims
- 0259US6753219B2Method of manufacturing semiconductor integrated circuit devices having a memory device with a reduced bit line stray capacity and such semiconductor integrated circuit devicesHITACHI LTD·Filed 2002·Granted Jun 22, 2004·8 cites·7 claims
- 0340US6969649B2Method of manufacturing semiconductor integrated circuit devices having a memory device with a reduced bit line stray capacity and such semiconductor integrated circuit devicesTEXAS INSTRUMENTS INC·Filed 2004·Granted Nov 29, 2005·0 cites·3 claims
- 0439US5937290AMethod of manufacturing semiconductor integrated circuit devices using phase shifting maskHITACHI LTD·Filed 1997·Granted Aug 10, 1999·8 cites·4 claims
- 0535US6077735AMethod of manufacturing semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1996·Granted Jun 20, 2000·6 cites·7 claims
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