Inventor
HILL RAYMOND
CA48 patents
⚠️ This page may combine multiple inventors who share the name “HILL RAYMOND”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ALIS CORP
16 patentsUS7786452B2Aug 31, 2010
Ion sources, systems and methods
ALIS CORP61 citations98
US7557359B2Jul 7, 2009
Ion sources, systems and methods
ALIS CORP71 citations98
US7557361B2Jul 7, 2009
Ion sources, systems and methods
ALIS CORP67 citations98
US7557358B2Jul 7, 2009
Ion sources, systems and methods
ALIS CORP69 citations98
US7554097B2Jun 30, 2009
Ion sources, systems and methods
ALIS CORP74 citations98
US7554096B2Jun 30, 2009
Ion sources, systems and methods
ALIS CORP100 citations98
US7557360B2Jul 7, 2009
Ion sources, systems and methods
ALIS CORP67 citations97
US7786451B2Aug 31, 2010
Ion sources, systems and methods
ALIS CORP58 citations96
US7521693B2Apr 21, 2009
Ion sources, systems and methods
ALIS CORP23 citations92
US7518122B2Apr 14, 2009
Ion sources, systems and methods
ALIS CORP19 citations92
US7511280B2Mar 31, 2009
Ion sources, systems and methods
ALIS CORP26 citations92
US7511279B2Mar 31, 2009
Ion sources, systems and methods
ALIS CORP29 citations92
US7504639B2Mar 17, 2009
Ion sources, systems and methods
ALIS CORP24 citations92
US7495232B2Feb 24, 2009
Ion sources, systems and methods
ALIS CORP20 citations92
US7488952B2Feb 10, 2009
Ion sources, systems and methods
ALIS CORP20 citations92
US7485873B2Feb 3, 2009
Ion sources, systems and methods
ALIS CORP36 citations92
CARL ZEISS MICROSCOPY LLC
6 patentsUS9236225B2Jan 12, 2016
Ion sources, systems and methods
CARL ZEISS MICROSCOPY LLC4 citations83
US9012867B2Apr 21, 2015
Ion sources, systems and methods
CARL ZEISS MICROSCOPY LLC1 citations61
US9536699B2Jan 3, 2017
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC0 citations50
US9530612B2Dec 27, 2016
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC0 citations48
US9530611B2Dec 27, 2016
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC0 citations48
US10037862B2Jul 31, 2018
Charged particle detecting device and charged particle beam system with same
CARL ZEISS MICROSCOPY LLC0 citations38
AVID TECHNOLOGY INC
4 patentsUS5930797AJul 27, 1999
Method and system for representing hierarchical time-based data structures and to extract information therefrom
AVID TECHNOLOGY INC138 citations99
US6023703AFeb 8, 2000
Method and system for representing hierarchical time-based data structures and to extract information therefrom
AVID TECHNOLOGY INC91 citations98
US6948128B2Sep 20, 2005
Nonlinear editing system and method of constructing an edit therein
AVID TECHNOLOGY INC21 citations91
US6664966B1Dec 16, 2003
Non linear editing system and method of constructing an edit therein
AVID TECHNOLOGY INC20 citations91
FEI CO
4 patentsHILL RAYMOND
4 patentsUS8101928B2Jan 24, 2012
Deflection signal compensation for charged particle beam
HILL RAYMOND21 citations86
US8399864B2Mar 19, 2013
Dual beam system
HILL RAYMOND2 citations60
US8766210B2Jul 1, 2014
Variable energy charged particle systems
HILL RAYMOND0 citations48
US9000396B2Apr 7, 2015
Charged particle detectors
HILL RAYMOND0 citations38