P

Inventor

PARK HWAN-SHIK

KR5 patents
⚠️ This page may combine multiple inventors who share the name “PARK HWAN-SHIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

3 patents
US7375003B2May 20, 2008

Methods of manufacturing a semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations60
US7197426B2Mar 27, 2007

Method and apparatus for measuring thickness of metal layer

SAMSUNG ELECTRONICS CO LTD3 citations60
US7355729B2Apr 8, 2008

Apparatus and method for measuring a thickness of a substrate

SAMSUNG ELECTRONICS CO LTD1 citations49

PARK JANG-IK

1 patent
US8551791B2Oct 8, 2013

Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis

PARK JANG-IK1 citations38

KIM HYUN-JONG

1 patent
US8446583B2May 21, 2013

Light focusing unit and spectrum measuring apparatus having the same

KIM HYUN-JONG0 citations37