Inventor
FUKUHARA HIDEYUKI
JP9 patents
⚠️ This page may combine multiple inventors who share the name “FUKUHARA HIDEYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
7 patentsUS5618750AApr 8, 1997
Method of making fuse with non-corrosive termination of corrosive fuse material
TEXAS INSTRUMENTS INC65 citations95
US6249472B1Jun 19, 2001
Semiconductor memory device with antifuse
TEXAS INSTRUMENTS INC63 citations94
US6038191AMar 14, 2000
Circuit for reducing stand-by current induced by defects in memory array
TEXAS INSTRUMENTS INC38 citations92
US5754432AMay 19, 1998
Apparatus and method for estimating chip yield
TEXAS INSTRUMENTS INC26 citations88
US5641701AJun 24, 1997
Method for fabricating a semiconductor device with laser programable fuses
TEXAS INSTRUMENTS INC13 citations73
US6331739B1Dec 18, 2001
Fuse in top level metal and in a step, process of making and process of trimming
TEXAS INSTRUMENTS INC10 citations71
US5650355AJul 22, 1997
Process of making and process of trimming a fuse in a top level metal and in a step
TEXAS INSTRUMENTS INC7 citations71
ADVANTEST CORP
2 patentsUS6434063B1Aug 13, 2002
Method of repairing semiconductor memory, electron-beam memory repairing apparatus and redundancy memory circuit to which the method of repairing semiconductor memory is applicable
ADVANTEST CORP8 citations71
US5985677ANov 16, 1999
Method of repairing semiconductor memory, electron-beam memory repairing apparatus and redundancy memory circuit to which the method of repairing semiconductor memory is applicable
ADVANTEST CORP5 citations71