Inventor

SRINIVASAN LAKSHMAN

US4 patents

⚠️ This page may combine multiple inventors who share the name “SRINIVASAN LAKSHMAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ULTRAPOINTE CORP

2 patents

US5808735ASep 15, 1998

Method for characterizing defects on semiconductor wafers

ULTRAPOINTE CORP146 citations97

US5798830AAug 25, 1998

Method of establishing thresholds for image comparison

ULTRAPOINTE CORP16 citations70

APPLIED MATERIALS INC

1 patent

US7065239B2Jun 20, 2006

Automated repetitive array microstructure defect inspection

APPLIED MATERIALS INC69 citations92

PHOTON DYNAMICS INC

1 patent

US7761182B2Jul 20, 2010

Automatic defect repair system

PHOTON DYNAMICS INC23 citations85