Inventor

LIU HSI-HUA

TW2 patents

⚠️ This page may combine multiple inventors who share the name “LIU HSI-HUA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

1 patent

US7817265B2Oct 19, 2010

Alignment mark and defect inspection method

UNITED MICROELECTRONICS CORP6 citations59

HUANG PONG-WEY

1 patent

US8487644B2Jul 16, 2013

Method and pattern carrier for optimizing inspection recipe of defect inspection tool

HUANG PONG-WEY1 citations39