Inventor

LEI SHUEN-CHENG

TW3 patents

⚠️ This page may combine multiple inventors who share the name “LEI SHUEN-CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

1 patent

US7817265B2Oct 19, 2010

Alignment mark and defect inspection method

UNITED MICROELECTRONICS CORP6 citations59

KUO CHIEN-LI

1 patent

US8516400B2Aug 20, 2013

Method for predicting tolerable spacing between conductors in semiconductor process

KUO CHIEN-LI4 citations57

HUANG PONG-WEY

1 patent

US8487644B2Jul 16, 2013

Method and pattern carrier for optimizing inspection recipe of defect inspection tool

HUANG PONG-WEY1 citations39