Inventor
BEFFA RAYMOND J
US57 patents
⚠️ This page may combine multiple inventors who share the name “BEFFA RAYMOND J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
48 patentsUS5927512AJul 27, 1999
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC107 citations99
US5915231AJun 22, 1999
Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture
MICRON TECHNOLOGY INC116 citations99
US5844803ADec 1, 1998
Method of sorting a group of integrated circuit devices for those devices requiring special testing
MICRON TECHNOLOGY INC114 citations99
US6324088B1Nov 27, 2001
256 meg dynamic random access memory
MICRON TECHNOLOGY INC72 citations97
US5898186AApr 27, 1999
Reduced terminal testing system
MICRON TECHNOLOGY INC71 citations97
US6788993B2Sep 7, 2004
Sorting a group of integrated circuit devices for those devices requiring special testing
MICRON TECHNOLOGY INC33 citations96
US6703573B2Mar 9, 2004
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC32 citations96
US6636068B2Oct 21, 2003
Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC40 citations96
US6594611B2Jul 15, 2003
Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture
MICRON TECHNOLOGY INC57 citations96
US6534785B1Mar 18, 2003
Reduced terminal testing system
MICRON TECHNOLOGY INC42 citations96
US6529793B1Mar 4, 2003
Method of sorting a group of integrated circuit devices for those devices requiring special testing
MICRON TECHNOLOGY INC57 citations96
US6504123B2Jan 7, 2003
Process for sorting integrated circuit devices
MICRON TECHNOLOGY INC41 citations96
US6452415B1Sep 17, 2002
Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC29 citations96
US6437271B1Aug 20, 2002
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC37 citations96
US6424168B1Jul 23, 2002
Reduced terminal testing system
MICRON TECHNOLOGY INC45 citations96
US6373011B1Apr 16, 2002
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC49 citations96
US6365860B1Apr 2, 2002
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC38 citations96
US6365861B1Apr 2, 2002
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC43 citations96
US6363329B2Mar 26, 2002
Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture
MICRON TECHNOLOGY INC40 citations96
US6350959B1Feb 26, 2002
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC42 citations96
US6313658B1Nov 6, 2001
Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor wafer
MICRON TECHNOLOGY INC48 citations96
US6307171B1Oct 23, 2001
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC30 citations96
US6292009B1Sep 18, 2001
Reduced terminal testing system
MICRON TECHNOLOGY INC58 citations96
US6208947B1Mar 27, 2001
Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture
MICRON TECHNOLOGY INC53 citations96
US6147316ANov 14, 2000
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC60 citations96
US6122563ASep 19, 2000
Method of sorting a group of integrated circuit devices for those devices requiring special testing
MICRON TECHNOLOGY INC49 citations96
US6118138ASep 12, 2000
Reduced terminal testing system
MICRON TECHNOLOGY INC46 citations96
US6100486AAug 8, 2000
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC58 citations96
US6067507AMay 23, 2000
Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processd during their manufacture
MICRON TECHNOLOGY INC56 citations96
US5994915ANov 30, 1999
Reduced terminal testing system
MICRON TECHNOLOGY INC68 citations96
US5976899ANov 2, 1999
Reduced terminal testing system
MICRON TECHNOLOGY INC31 citations96
US7567091B2Jul 28, 2009
Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC11 citations93
US7124050B2Oct 17, 2006
Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture
MICRON TECHNOLOGY INC12 citations93
US7107117B2Sep 12, 2006
Sorting a group of integrated circuit devices for those devices requiring special testing
MICRON TECHNOLOGY INC11 citations93
US6944567B2Sep 13, 2005
Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture
MICRON TECHNOLOGY INC22 citations93
US6831475B2Dec 14, 2004
Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC14 citations93
US7502659B2Mar 10, 2009
Sorting a group of integrated circuit devices for those devices requiring special testing
MICRON TECHNOLOGY INC8 citations84
US7477557B2Jan 13, 2009
256 Meg dynamic random access memory
MICRON TECHNOLOGY INC7 citations82
US7034561B2Apr 25, 2006
Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC9 citations82
US6852999B2Feb 8, 2005
Reduced terminal testing system
MICRON TECHNOLOGY INC11 citations82
US7489564B2Feb 10, 2009
256 Meg dynamic random access memory
MICRON TECHNOLOGY INC4 citations74
US7477556B2Jan 13, 2009
256 Meg dynamic random access memory
MICRON TECHNOLOGY INC3 citations74
US7368678B2May 6, 2008
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC4 citations74
US7323896B2Jan 29, 2008
Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC3 citations74
US7315179B2Jan 1, 2008
System for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC3 citations74
US7276672B2Oct 2, 2007
Method for sorting integrated circuit devices
MICRON TECHNOLOGY INC6 citations74
US7276926B2Oct 2, 2007
Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC6 citations74
US7276927B2Oct 2, 2007
Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
MICRON TECHNOLOGY INC4 citations74
KEETH BRENT
1 patentROUND ROCK RES LLC
1 patentShowing the top 50 of 57 patents by PatentIndex Score.