Inventor
CAO MIN
TW113 patents
⚠️ This page may combine multiple inventors who share the name “CAO MIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AGILENT TECHNOLOGIES INC
11 patentsUS6111300AAug 29, 2000
Multiple color detection elevated pin photo diode active pixel sensor
AGILENT TECHNOLOGIES INC72 citations94
US6387736B1May 14, 2002
Method and structure for bonding layers in a semiconductor device
AGILENT TECHNOLOGIES INC34 citations92
US6229191B1May 8, 2001
Conductive guard rings for elevated active pixel sensors
AGILENT TECHNOLOGIES INC24 citations92
US6215164B1Apr 10, 2001
Elevated image sensor array which includes isolation between uniquely shaped image sensors
AGILENT TECHNOLOGIES INC53 citations92
US6114739ASep 5, 2000
Elevated pin diode active pixel sensor which includes a patterned doped semiconductor electrode
AGILENT TECHNOLOGIES INC33 citations91
US6396118B1May 28, 2002
Conductive mesh bias connection for an array of elevated active pixel sensors
AGILENT TECHNOLOGIES INC25 citations90
US6545711B1Apr 8, 2003
Photo diode pixel sensor array having a guard ring
AGILENT TECHNOLOGIES INC14 citations84
US6265325B1Jul 24, 2001
Method for fabricating dual gate dielectric layers
AGILENT TECHNOLOGIES INC19 citations84
US6586812B1Jul 1, 2003
Isolation of alpha silicon diode sensors through ion implantation
AGILENT TECHNOLOGIES INC9 citations74
US6384460B1May 7, 2002
Self-aligned metal electrode structure for elevated sensors
AGILENT TECHNOLOGIES INC8 citations74
US7038242B2May 2, 2006
Amorphous semiconductor open base phototransistor array
AGILENT TECHNOLOGIES INC7 citations72
TAIWAN SEMICONDUCTOR MFG CO LTD
10 patentsUS10991756B2Apr 27, 2021
Bipolar selector with independently tunable threshold voltages
TAIWAN SEMICONDUCTOR MFG CO LTD11 citations85
US11404476B2Aug 2, 2022
Bipolar selector with independently tunable threshold voltages
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US11075195B2Jul 27, 2021
Integrated hybrid standard cell structure with gate-all-around device
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10700125B2Jun 30, 2020
Integrated system chip with magnetic module
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10535680B2Jan 14, 2020
Integrated circuit structure and method with hybrid orientation for FinFET
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US11792999B2Oct 17, 2023
Bipolar selector with independently tunable threshold voltages
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11764203B2Sep 19, 2023
Integrated hybrid standard cell structure with gate-all-around device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11222958B2Jan 11, 2022
Negative capacitance transistor with external ferroelectric structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11121037B2Sep 14, 2021
Semiconductor device structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11990169B2May 21, 2024
Transistorless memory cell
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
TAIWAN SEMICONDUCTOR MFG
6 patentsUS8362573B2Jan 29, 2013
Integrated circuits and manufacturing methods thereof
TAIWAN SEMICONDUCTOR MFG6 citations84
US7943961B2May 17, 2011
Strain bars in stressed layers of MOS devices
TAIWAN SEMICONDUCTOR MFG12 citations84
US7305651B2Dec 4, 2007
Mask CD correction based on global pattern density
TAIWAN SEMICONDUCTOR MFG17 citations84
US7202145B2Apr 10, 2007
Strained Si formed by anneal
TAIWAN SEMICONDUCTOR MFG11 citations84
US7015129B2Mar 21, 2006
Bond pad scheme for Cu process
TAIWAN SEMICONDUCTOR MFG7 citations73
US7825477B2Nov 2, 2010
Semiconductor device with localized stressor
TAIWAN SEMICONDUCTOR MFG6 citations72
HEWLETT PACKARD CO
4 patentsUS6315384B1Nov 13, 2001
Thermal inkjet printhead and high-efficiency polycrystalline silicon resistor system for use therein
HEWLETT PACKARD CO152 citations96
US6267471B1Jul 31, 2001
High-efficiency polycrystalline silicon resistor system for use in a thermal inkjet printhead
HEWLETT PACKARD CO21 citations92
US6051867AApr 18, 2000
Interlayer dielectric for passivation of an elevated integrated circuit sensor structure
HEWLETT PACKARD CO29 citations92
US6016011AJan 18, 2000
Method and apparatus for a dual-inlaid damascene contact to sensor
HEWLETT PACKARD CO24 citations92
CAO MIN
4 patentsUS8739095B2May 27, 2014
Method, system, and program product for interactive checking for double pattern lithography violations
CAO MIN20 citations92
US8516404B1Aug 20, 2013
Methods, systems, and articles of manufacture for implementing constraint checking windows for an electronic design for multiple-patterning lithography processes
CAO MIN15 citations83
US8429574B2Apr 23, 2013
Dual-pattern coloring technique for mask design
CAO MIN5 citations83
US8420772B2Apr 16, 2013
Semi-aromatic polyamide and a method for preparation with low wastewater discharge
CAO MIN5 citations70
PERICOM SEMICONDUCTOR CORP
3 patentsUS6794707B1Sep 21, 2004
Variable capacitor using MOS gated diode with multiple segments to limit DC current
PERICOM SEMICONDUCTOR CORP23 citations93
US6674116B1Jan 6, 2004
Variable capacitor using MOS gated diode with multiple segments to limit DC current
PERICOM SEMICONDUCTOR CORP18 citations93
US6541814B1Apr 1, 2003
MOS variable capacitor with controlled dC/dV and voltage drop across W of gate
PERICOM SEMICONDUCTOR CORP12 citations73
CADENCE DESIGN SYSTEMS INC
3 patentsUS10049175B1Aug 14, 2018
Methods, systems, and articles of manufacture for interactively implementing physical electronic designs with track patterns
CADENCE DESIGN SYSTEMS INC6 citations83
US9117052B1Aug 25, 2015
Methods, systems, and articles of manufacture for interactively implementing physical electronic designs with track patterns
CADENCE DESIGN SYSTEMS INC15 citations82
US7657856B1Feb 2, 2010
Method and system for parallel processing of IC design layouts
CADENCE DESIGN SYSTEMS INC15 citations82
WUHAN WUDA ZOYON SCIENCE AND TECH CO LTD
2 patentsUS10755132B2Aug 25, 2020
Methods for extracting surface deformation feature of object based on linear scanning three-dimensional point cloud
WUHAN WUDA ZOYON SCIENCE AND TECH CO LTD2 citations70
US10489903B2Nov 26, 2019
Stepwise refinement detection method for pavement cracks
WUHAN WUDA ZOYON SCIENCE AND TECH CO LTD4 citations69
HEWLETT PACKARD CMPANY
1 patentSHARMA KARUN
1 patentNEC LAB AMERICA INC
1 patentYU HENRY
1 patentZONNSMART SCIENCE & TECH CO LTD
1 patentCISCO TECH INC
1 patentBANK OF AMERICA
1 patentShowing the top 50 of 113 patents by PatentIndex Score.