P

Inventor

PARK SEONG-GEON

KR19 patents
⚠️ This page may combine multiple inventors who share the name “PARK SEONG-GEON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

18 patents
US7081409B2Jul 25, 2006

Methods of producing integrated circuit devices utilizing tantalum amine derivatives

SAMSUNG ELECTRONICS CO LTD50 citations96
US7098131B2Aug 29, 2006

Methods for forming atomic layers and thin films including tantalum nitride and devices including the same

SAMSUNG ELECTRONICS CO LTD48 citations92
US7833855B2Nov 16, 2010

Methods of producing integrated circuit devices utilizing tantalum amine derivatives

SAMSUNG ELECTRONICS CO LTD10 citations84
US7452811B2Nov 18, 2008

Method for forming a wiring of a semiconductor device, method for forming a metal layer of a semiconductor device and apparatus for performing the same

SAMSUNG ELECTRONICS CO LTD10 citations84
US10186552B2Jan 22, 2019

Variable resistance memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD11 citations82
US10236444B2Mar 19, 2019

Variable resistance memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD2 citations73
US7223689B2May 29, 2007

Methods for forming a metal contact in a semiconductor device in which an ohmic layer is formed while forming a barrier metal layer

SAMSUNG ELECTRONICS CO LTD6 citations73
US7105444B2Sep 12, 2006

Method for forming a wiring of a semiconductor device, method for forming a metal layer of a semiconductor device and apparatus for performing the same

SAMSUNG ELECTRONICS CO LTD6 citations73
US7056776B2Jun 6, 2006

Semiconductor devices having metal containing N-type and P-type gate electrodes and methods of forming the same

SAMSUNG ELECTRONICS CO LTD8 citations73
US7531881B2May 12, 2009

Semiconductor devices having transistors with different gate structures and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD2 citations62
US10403818B2Sep 3, 2019

Method of forming semiconductor devices having threshold switching devices

SAMSUNG ELECTRONICS CO LTD1 citations61
US6806135B2Oct 19, 2004

Method of manufacturing a semiconductor device using a two-step deposition process

SAMSUNG ELECTRONICS CO LTD5 citations60
US10636968B2Apr 28, 2020

Variable resistance memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations52
US7892958B2Feb 22, 2011

Methods of fabricating semiconductor devices having transistors with different gate structures

SAMSUNG ELECTRONICS CO LTD0 citations52
US7399670B2Jul 15, 2008

Methods of forming different gate structures in NMOS and PMOS regions and gate structures so formed

SAMSUNG ELECTRONICS CO LTD0 citations52
US11037988B2Jun 15, 2021

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations51
US10714685B2Jul 14, 2020

Methods of forming semiconductor devices having threshold switching devices

SAMSUNG ELECTRONICS CO LTD0 citations51
US9293700B2Mar 22, 2016

Nonvolatile memory cell and nonvolatile memory device including the same

SAMSUNG ELECTRONICS CO LTD1 citations51

JU HYUN-SU

1 patent