Inventor
PARK SEONG-GEON
KR19 patents
⚠️ This page may combine multiple inventors who share the name “PARK SEONG-GEON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
18 patentsUS7081409B2Jul 25, 2006
Methods of producing integrated circuit devices utilizing tantalum amine derivatives
SAMSUNG ELECTRONICS CO LTD50 citations96
US7098131B2Aug 29, 2006
Methods for forming atomic layers and thin films including tantalum nitride and devices including the same
SAMSUNG ELECTRONICS CO LTD48 citations92
US7833855B2Nov 16, 2010
Methods of producing integrated circuit devices utilizing tantalum amine derivatives
SAMSUNG ELECTRONICS CO LTD10 citations84
US7452811B2Nov 18, 2008
Method for forming a wiring of a semiconductor device, method for forming a metal layer of a semiconductor device and apparatus for performing the same
SAMSUNG ELECTRONICS CO LTD10 citations84
US10186552B2Jan 22, 2019
Variable resistance memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD11 citations82
US10236444B2Mar 19, 2019
Variable resistance memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations73
US7223689B2May 29, 2007
Methods for forming a metal contact in a semiconductor device in which an ohmic layer is formed while forming a barrier metal layer
SAMSUNG ELECTRONICS CO LTD6 citations73
US7105444B2Sep 12, 2006
Method for forming a wiring of a semiconductor device, method for forming a metal layer of a semiconductor device and apparatus for performing the same
SAMSUNG ELECTRONICS CO LTD6 citations73
US7056776B2Jun 6, 2006
Semiconductor devices having metal containing N-type and P-type gate electrodes and methods of forming the same
SAMSUNG ELECTRONICS CO LTD8 citations73
US7531881B2May 12, 2009
Semiconductor devices having transistors with different gate structures and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD2 citations62
US10403818B2Sep 3, 2019
Method of forming semiconductor devices having threshold switching devices
SAMSUNG ELECTRONICS CO LTD1 citations61
US6806135B2Oct 19, 2004
Method of manufacturing a semiconductor device using a two-step deposition process
SAMSUNG ELECTRONICS CO LTD5 citations60
US10636968B2Apr 28, 2020
Variable resistance memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7892958B2Feb 22, 2011
Methods of fabricating semiconductor devices having transistors with different gate structures
SAMSUNG ELECTRONICS CO LTD0 citations52
US7399670B2Jul 15, 2008
Methods of forming different gate structures in NMOS and PMOS regions and gate structures so formed
SAMSUNG ELECTRONICS CO LTD0 citations52
US11037988B2Jun 15, 2021
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations51
US10714685B2Jul 14, 2020
Methods of forming semiconductor devices having threshold switching devices
SAMSUNG ELECTRONICS CO LTD0 citations51
US9293700B2Mar 22, 2016
Nonvolatile memory cell and nonvolatile memory device including the same
SAMSUNG ELECTRONICS CO LTD1 citations51