Inventor
MAK TAK M
US17 patents
⚠️ This page may combine multiple inventors who share the name “MAK TAK M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
14 patentsUS6222246B1Apr 24, 2001
Flip-chip having an on-chip decoupling capacitor
INTEL CORP106 citations98
US5621739AApr 15, 1997
Method and apparatus for buffer self-test and characterization
INTEL CORP184 citations96
US6885209B2Apr 26, 2005
Device testing
INTEL CORP56 citations95
US6629274B1Sep 30, 2003
Method and apparatus to structurally detect random defects that impact AC I/O timings in an input/output buffer
INTEL CORP56 citations94
US7278074B2Oct 2, 2007
System and shadow circuits with output joining circuit
INTEL CORP45 citations92
US7278076B2Oct 2, 2007
System and scanout circuits with error resilience circuit
INTEL CORP37 citations92
US6975954B2Dec 13, 2005
Functional testing of logic circuits that use high-speed links
INTEL CORP23 citations92
US6424926B1Jul 23, 2002
Bus signature analyzer and behavioral functional test method
INTEL CORP41 citations92
US7373572B2May 13, 2008
System pulse latch and shadow pulse latch coupled to output joining circuit
INTEL CORP32 citations89
US7188284B2Mar 6, 2007
Error detecting circuit
INTEL CORP42 citations89
US8926196B2Jan 6, 2015
Method and apparatus for an optical interconnect system
INTEL CORP13 citations83
US7185247B2Feb 27, 2007
Pseudo bus agent to support functional testing
INTEL CORP7 citations74
US6721216B2Apr 13, 2004
Memory addressing structural test
INTEL CORP9 citations72
US6757209B2Jun 29, 2004
Memory cell structural test
INTEL CORP3 citations61