Inventor
SAVCHENKO KIRILL
IL4 patents
Patents
4 patentsUS11037286B2Jun 15, 2021
Method of classifying defects in a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD2 citations67
US11151706B2Oct 19, 2021
Method of classifying defects in a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD0 citations48
US10921334B2Feb 16, 2021
System, method and computer program product for classifying defects
APPLIED MATERIALS ISRAEL LTD0 citations48
US12361531B2Jul 15, 2025
Machine learning-based classification of defects in a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations47