P

Inventor

YOO CHA-YOUNG

KR71 patents
⚠️ This page may combine multiple inventors who share the name “YOO CHA-YOUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

45 patents
US7482677B2Jan 27, 2009

Dielectric structures having high dielectric constants, and non-volatile semiconductor memory devices having the dielectric structures

SAMSUNG ELECTRONICS CO LTD88 citations98
US6580111B2Jun 17, 2003

Metal-insulator-metal capacitor

SAMSUNG ELECTRONICS CO LTD77 citations98
US7018933B2Mar 28, 2006

Method of forming a metal-insulator-metal capacitor

SAMSUNG ELECTRONICS CO LTD30 citations93
US6750092B2Jun 15, 2004

Methods of forming ruthenium film by changing process conditions during chemical vapor deposition and ruthenium films formed thereby

SAMSUNG ELECTRONICS CO LTD21 citations93
US6221742B1Apr 24, 2001

Method for fabricating polysilicon film for semiconductor device

SAMSUNG ELECTRONICS CO LTD23 citations93
US6039811AMar 21, 2000

Apparatus for fabricating polysilicon film for semiconductor device

SAMSUNG ELECTRONICS CO LTD18 citations93
US5721153AFeb 24, 1998

Method of making capacitor of highly integrated semiconductor device using multiple insulation layers

SAMSUNG ELECTRONICS CO LTD22 citations93
US7723770B2May 25, 2010

Integrated circuit capacitors having composite dielectric layers therein containing crystallization inhibiting regions

SAMSUNG ELECTRONICS CO LTD15 citations92
US6815221B2Nov 9, 2004

Method for manufacturing capacitor of semiconductor memory device controlling thermal budget

SAMSUNG ELECTRONICS CO LTD23 citations92
US5622889AApr 22, 1997

High capacitance capacitor manufacturing method

SAMSUNG ELECTRONICS CO LTD27 citations92
US7655519B2Feb 2, 2010

Methods of fabricating metal-insulator-metal capacitors with a chemical barrier layer in a lower electrode

SAMSUNG ELECTRONICS CO LTD9 citations84
US7179739B2Feb 20, 2007

Methods of forming a semiconductor device including a metal silicide layer between a conductive plug and a bottom electrode of a capacitor

SAMSUNG ELECTRONICS CO LTD10 citations84
US7172946B2Feb 6, 2007

Methods for forming semiconductor devices including thermal processing

SAMSUNG ELECTRONICS CO LTD10 citations84
US6680251B2Jan 20, 2004

Methods of chemical vapor depositing ruthenium by varying chemical vapor deposition parameters

SAMSUNG ELECTRONICS CO LTD16 citations84
US6653186B2Nov 25, 2003

Methods of fabrication integrated circuit capacitors having a dielectric layer between a u-shaped lower electrode and a support layer

SAMSUNG ELECTRONICS CO LTD15 citations84
US6613629B2Sep 2, 2003

Methods for manufacturing storage nodes of stacked capacitors

SAMSUNG ELECTRONICS CO LTD16 citations84
US6537875B2Mar 25, 2003

Semiconductor memory device for reducing damage to interlevel dielectric layer and fabrication method thereof

SAMSUNG ELECTRONICS CO LTD15 citations84
US8790986B2Jul 29, 2014

Methods of manufacturing semiconductor devices

SAMSUNG ELECTRONICS CO LTD7 citations82
US7973352B2Jul 5, 2011

Capacitors having composite dielectric layers containing crystallization inhibiting regions

SAMSUNG ELECTRONICS CO LTD4 citations74
US7049232B2May 23, 2006

Methods for forming ruthenium films with β-diketone containing ruthenium complexes and method for manufacturing metal-insulator-metal capacitor using the same

SAMSUNG ELECTRONICS CO LTD8 citations74
US7008837B2Mar 7, 2006

Method of manufacturing capacitor by performing multi-stepped wet treatment on surface of electrode

SAMSUNG ELECTRONICS CO LTD7 citations74
US6806183B2Oct 19, 2004

Methods for forming capacitors on semiconductor substrates

SAMSUNG ELECTRONICS CO LTD10 citations74
US6762091B2Jul 13, 2004

Methods for manufacturing semiconductor devices having a metal layer

SAMSUNG ELECTRONICS CO LTD7 citations74
US6743678B2Jun 1, 2004

Methods for manufacturing semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD11 citations74
US6146935ANov 14, 2000

Method for forming capacitor of semiconductor device using pre-bake

SAMSUNG ELECTRONICS CO LTD13 citations74
US6087226AJul 11, 2000

Methods of forming capacitors including electrodes with hemispherical grained silicon layers on sidewalls thereof and related structures

SAMSUNG ELECTRONICS CO LTD13 citations74
US6004858ADec 21, 1999

Methods of forming hemispherical grained silicon (HSG-Si) capacitor structures including protective layers

SAMSUNG ELECTRONICS CO LTD10 citations74
US5943570AAug 24, 1999

Methods of forming capacitor electrodes containing HSG semiconductor layers therein

SAMSUNG ELECTRONICS CO LTD12 citations74
US7205219B2Apr 17, 2007

Methods of forming integrated circuits devices having pad contact plugs in the cell array and peripheral circuit regions of the integrated circuit substrate

SAMSUNG ELECTRONICS CO LTD5 citations73
US6046927AApr 4, 2000

Nonvolatile semiconductor memory device, a method of fabricating the same, and read, erase write methods of the same

SAMSUNG ELECTRONICS CO LTD12 citations73
US9059330B2Jun 16, 2015

Methods of forming integrated circuit capacitors having composite dielectric layers therein containing crystallization inhibiting regions

SAMSUNG ELECTRONICS CO LTD1 citations63
US7485585B2Feb 3, 2009

Method of forming a thin film, method of manufacturing a gate structure using the same and method of manufacturing a capacitor using the same

SAMSUNG ELECTRONICS CO LTD3 citations63
US7442981B2Oct 28, 2008

Capacitor of semiconductor device and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD4 citations63
US7402491B2Jul 22, 2008

Methods of manufacturing a semiconductor device including a dielectric layer including zirconium

SAMSUNG ELECTRONICS CO LTD4 citations63
US7279392B2Oct 9, 2007

Thin film structure, capacitor, and methods for forming the same

SAMSUNG ELECTRONICS CO LTD6 citations63
US7091102B2Aug 15, 2006

Methods of forming integrated circuit devices having a capacitor with a hydrogen barrier spacer on a sidewall thereof and integrated circuit devices formed thereby

SAMSUNG ELECTRONICS CO LTD4 citations63
US7049648B2May 23, 2006

Semiconductor memory device for reducing damage to interlevel dielectric layer and fabrication method thereof

SAMSUNG ELECTRONICS CO LTD2 citations63
US7042042B2May 9, 2006

Integrated circuit capacitors having a dielectric layer between a U-shaped lower electrode and a support layer

SAMSUNG ELECTRONICS CO LTD5 citations63
US7034350B2Apr 25, 2006

Capacitors including a cavity containing a buried layer

SAMSUNG ELECTRONICS CO LTD3 citations63
US6884673B2Apr 26, 2005

Methods of forming integrated circuit devices having metal-insulator-metal (MIM) capacitor

SAMSUNG ELECTRONICS CO LTD6 citations63
US6806139B2Oct 19, 2004

Method of fabricating a MIM capacitor using etchback

SAMSUNG ELECTRONICS CO LTD4 citations63
US7495292B2Feb 24, 2009

Integrated circuit devices having pad contact plugs in the cell array and peripheral circuit regions of the integrated circuit substrate

SAMSUNG ELECTRONICS CO LTD3 citations62
US7314806B2Jan 1, 2008

Methods of forming metal-insulator-metal (MIM) capacitors with separate seed

SAMSUNG ELECTRONICS CO LTD5 citations62
US6995071B2Feb 7, 2006

Methods of forming MIM type capacitor structures using low temperature plasma processing

SAMSUNG ELECTRONICS CO LTD6 citations62
US6927166B2Aug 9, 2005

Method for manufacturing semiconductor devices and integrated circuit capacitors whereby degradation of surface morphology of a metal layer from thermal oxidation is suppressed

SAMSUNG ELECTRONICS CO LTD2 citations62

EUGENE TECHNOLOGY CO LTD

2 patents

CHUNG BYUNG-HONG

1 patent

CHUNG SUK-JIN

1 patent

SAMSUNG ELECTRONICS CO INC

1 patent

Showing the top 50 of 71 patents by PatentIndex Score.