Inventor
RAVID DANIEL
IL5 patents
Patents
5 patentsUS11205119B2Dec 21, 2021
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD11 citations84
US12183066B2Dec 31, 2024
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD1 citations71
US11348001B2May 31, 2022
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD3 citations71
US11010665B2May 18, 2021
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD3 citations71
US9715724B2Jul 25, 2017
Registration of CAD data with SEM images
APPLIED MATERIALS ISRAEL LTD2 citations69