Inventor

SHINOSKY MICHAEL A

US4 patents

⚠️ This page may combine multiple inventors who share the name “SHINOSKY MICHAEL A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

1 patent

US9851397B2Dec 26, 2017

Electromigration testing of interconnect analogues having bottom-connected sensory pins

GLOBALFOUNDRIES INC2 citations71

IBM

1 patent

US9453873B2Sep 27, 2016

Non-planar field effect transistor test structure and lateral dielectric breakdown testing method

IBM2 citations59

BROCHU JR DAVID G

1 patent

US8754655B2Jun 17, 2014

Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migration

BROCHU JR DAVID G3 citations56

CHEN FEN

1 patent

US8525153B2Sep 3, 2013

Structure including voltage controlled negative resistance

CHEN FEN0 citations50