Inventor · disambiguated record

Vinayak Dattatreya Phalke

Also filed as: PHALKE VINAYAK DATTATREYA

1 granted patent·8 citations·filing 2008–2008

31Inventor score

Technology areasG06T

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0168US8090189B1Detection of thin line for selective sensitivity during reticle inspectionPHALKE VINAYAK DATTATREYA·Filed 2008·Granted Jan 3, 2012·8 cites·18 claims

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